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CINDE Journal, Nov/Dec 2000
Nov/Dec 2000
Feature Articles:

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  • Announcing the NDT 2000 Association
  • Evanescent Microwave Microscope: A New Nondestructive Material Evaluation Tool with Very High Resolution (Part 1) - by M. Tabib-Azar
  • International News
  • New Membership Benefits (being considered)
  • Regulating Radiography; A Canadian Perspective - by D.W. Cochrane
  • Technical Tips: Film Processors - by John deLuca

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